میکروسکوپ نیروی اتمی رسانا: کاربردها در نانومواد ۲۰۱۷
Conductive Atomic Force Microscopy: Applications in Nanomaterials 2017

1. Cover

2. Title Page

3. Copyright

4. Table of Contents

5. Oxide Films and Conduction AFM

6. List of Contributors

7. Chapter 1: History and Status of the CAFM

8. Chapter 2: Fabrication and Reliability of Conductive AFM Probes

9. Chapter 3: Fundamentals of CAFM Operation Modes

10. Chapter 4: Investigation of High-k Dielectric Stacks by C-AFM: Advantages, Limitations, and Possible Applications

11. Chapter 5: Characterization of Grain Boundaries in Polycrystalline HfO2 Dielectrics

12. Chapter 6: CAFM Studies on Individual GeSi Quantum Dots and Quantum Rings

13. Chapter 7: Conductive Atomic Force Microscopy of Two-Dimensional Electron Systems: From AlGaN/GaN Heterostructures to Graphene and MoS2

14. Chapter 8: Nanoscale Three-Dimensional Characterization with Scalpel SPM

15. Chapter 9: Conductive Atomic Force Microscopy for Nanolithography Based on Local Anodic Oxidation

16. Chapter 10: Combination of Semiconductor Parameter Analyzer and Conductive Atomic Force Microscope for Advanced Nanoelectronic Characterization

17. Chapter 11: Design and Fabrication of a Logarithmic Amplifier for Scanning Probe Microscopes to Allow Wide-Range Current Measurements

18. Chapter 12: Enhanced Current Dynamic Range Using ResiScope™ and Soft-ResiScope™ AFM Modes

19. Chapter 13: Multiprobe Electrical Measurements without Optical Interference

20. Chapter 14: KPFM and its Use to Characterize the CPD in Different Materials

21. Chapter 15: Hot Electron Nanoscopy and Spectroscopy (HENs)

22. Index

23. End User License Agreement